MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States
vray
Replacement cartridges for Tungsten W(CO)6 and Molybdenum Hxacarvony Mo(CO)6 precursor efill of metal deposition gas injector in MIcrion and FEI Vectra, Vectra 986, 986+, Vectra Vision, IET/WDR, V600, FIB400 ACE, G4 Circuit Edit FIB systems
PBS&T is a trademark of MEO Engineering Company, Inc.
"Vectra," "Acura," "Micrion 2500," "Micrion 8000," "Micrion 9500," "Vectra 980," "Vectra 986," "Jupiter Head," "FEI," "Micrion," "FEI Company," "V600," "Helios," "FIB400," "FIB400 ACE," "Scios," "Sidewinder," "Certus," "ExSolve," "CLM," "Altura," "Expida," "Tomahawk," and "Phoenix" are trademarks and property of FEI Company, Inc. - now Thermo Fisher Scientific. Omniprobe and Omni-GIS are trademarks and property of Oxford Instruments. "Auriga," "Crossbeam," and "Zeiss" are trademarks and property of Carl Zeiss. "Orsay" and "Tescan" are trademarks and property of Tescan-Orsay Holding a.s. "eLINE," "iLINE," and "Raith" are trademarks and property of Raith GmbH. Other trademarks are property of their respective owners. These trademarks are nominatively used for the sole purpose of accurately identifying equipment compatible with PBS&T services, parts, consumables, and accessories.
Chemical deposition precursor for Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in FIB, SEM, and FIB/SEM with tools with original FEI Mono-GIS Gas Injectin System
Chemical deposition precursor for Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in FIB, SEM, and FIB/SEM with Orsay Gas Injection System
Chemical deposition precursor for Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in FIB, SEM, and FIB/SEM with GALEX D-GIS Injector
Chemical deposition precursor for Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in FIB, SEM, and FIB/SEM with Omniprobe Omni-GIS Gas Injection System
Chemical deposition precursor for Tungsten (W) and Molybdenum (Mo) in Vectra 986, Vectra 986+, Vectra Vision, Vectra Vision IET/WDR Focused Ion Beam Circuit Edit systems made by former Micrion and FEI Companies
Chemical deposition precursor for Tungsten (W) and Molybdenum (Mo) in V600, V400, FIB400 ACE and other Focused Ion Beam Circuit Edit systems made by FEI Company, now Thermo Fisher Scientific
MEO Engineering Company, Inc. is providing customized technological solutions and scientific instrumentation, including third-party accessories, consumables, parts, service, and support for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), dual-beam FIB/SEM equipment from various manufacturers. Trademarks identifying supported FIB, SEM, and dual-beam FIB/SEM instrumentaton are property of the respective original equipment manufacturers and nominatively used for the sole purpose of accurately identifying equipment compatible with parts, services, and accessories provided by MEO Engineering Company.
Copyright 2004-2020 MEO Engineering Company. All rights reserved.
MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States
vray