MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States
vray
FIB or SEM - any OEM
Cartridges for chemical vapor deposition precursors compatible with gas injections systems of all major Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), and dual-beam FIB/SEM instruments replace OEM crucibles in Micrion, FEI, Thermo Fisher Scientific, Orsay, Tescan, Raith, ZEISS, GALEX, and Omniprobe gas injectors.
P/N CP_0060_00 is empty cartridge for DIY refill of the deposition precursor.
For valve replacement kit see P/N RK_1060_70. For cartridge filled with 20gram of Tungsten Hexacarbonyl W(CO)6 deposition precursor see P/N CP_0060_GW, for cartridge filled with 20 gram of Molybdenum Mo(CO)6 deposition precursor see P/N CP_0060_GM, for upgrade kit see P/N UK_1060_00
P/N CP_0060_00 is empty cartridge for DIY refill of the deposition precursor.
For valve replacement kit see P/N RK_1060_70. For cartridge filled with 20gram of Tungsten Hexacarbonyl W(CO)6 deposition precursor see P/N CP_0070_GW, for cartridge filled with 20 gram of Molybdenum Mo(CO)6 deposition precursor see P/N CP_0070_GM, for upgrade kit see P/N UK_1070_00.
Order online or ontact with RFQPBS&T is a trademark of MEO Engineering Company, Inc. D.B.A.
"Vectra," "Acura," "Micrion 2500," "Micrion 8000," "Micrion 9500," "Vectra 980," "Vectra 986," "Jupiter Head," "FEI," "Micrion," "FEI Company," "V600," "Helios," "FIB400," "FIB400 ACE," "Scios," "Sidewinder," "Certus," "ExSolve," "CLM," "Altura," "Expida," "Tomahawk," and "Phoenix" are trademarks and property of FEI Company, Inc. - now Thermo Fisher Scientific. Omniprobe and Omni-GIS are trademarks and property of Oxford Instruments. "Auriga," "Crossbeam," and "Zeiss" are trademarks and property of Carl Zeiss. "Orsay" and "Tescan" are trademarks and property of Tescan-Orsay Holding a.s. "eLINE," "iLINE," and "Raith" are trademarks and property of Raith GmbH. Other trademarks are property of their respective owners. These trademarks are nominatively used for the sole purpose of accurately identifying equipment compatible with PBS&T services, parts, consumables, and accessories.
MEO Engineering Company, Inc. is providing customized technological solutions and scientific instrumentation, including third-party accessories, consumables, parts, service, and support for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), dual-beam FIB/SEM equipment from various manufacturers. Trademarks identifying supported FIB, SEM, and dual-beam FIB/SEM instrumentaton are property of the respective original equipment manufacturers and nominatively used for the sole purpose of accurately identifying equipment compatible with parts, services, and accessories provided by MEO Engineering Company.
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MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States
vray