Particle Beam Systems & Technology

MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States

vray@partbeamsystech.com

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  • High VoltageClick to open the High Voltage menu
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  • FIB Consumables
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  • Precursor RefillsClick to open the Precursor Refills menu
    • Deposition Precursors
    • Etching Precursors
    • Precursor Crucibles
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Precursor Crucible replacement

FIB or SEM - any OEM

Cartridges for chemical vapor deposition precursors compatible with gas injections systems of all major Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), and dual-beam FIB/SEM instruments replace OEM crucibles in Micrion, FEI, Thermo Fisher Scientific, Orsay, Tescan, Raith, ZEISS, GALEX, and Omniprobe gas injectors.

  • Replacement cartridge for Tungsten or Molybdenum Hexacarvonyl metal deposition precursor, compatible with gas injection nozzle assembly of Vectra, Vectra 986, Vectra 986+, Vectra Vision, V65, IET and WDR Focused Ion Beam Circuit Edit (FIB-CE)  instruments from former Micrion and FEI Companies

    Tungsten Molybdenum Hexacarbonyl Chemical Deposition Precursor Focused Ion Beam

    P/N CP_0060_00 is empty cartridge  for DIY refill of the deposition precursor.

    For valve replacement kit see P/N RK_1060_70. For cartridge filled with 20gram of Tungsten Hexacarbonyl W(CO)6 deposition precursor see P/N CP_0060_GW, for cartridge filled with 20 gram of Molybdenum Mo(CO)6 deposition precursor see  P/N CP_0060_GM, for upgrade kit see P/N UK_1060_00

    Order online or ontact with RFQ

  • Replacement cartridge for Tungsten or Molybdenum Hexacarvonyl metal deposition precursor, compatible with gas injection nozzle assembly of V600, V400, FIB400 ACE, G4 Focused Ion Beam Circuit Edit (FIB-CE) instruments from FEI Co., now Thermo Fisher Scientific

    Tungsten Molybdenum Hexacarbonyl Deposition Focused Ion Beam V600 FIB400 ACE FEI

    P/N CP_0060_00 is empty cartridge  for DIY refill of the deposition precursor.

    For valve replacement kit see P/N RK_1060_70. For cartridge filled with 20gram of Tungsten Hexacarbonyl W(CO)6 deposition precursor see P/N CP_0070_GW, for cartridge filled with 20 gram of Molybdenum Mo(CO)6 deposition precursor see  P/N CP_0070_GM, for upgrade kit see P/N UK_1070_00.

    Order online or ontact with RFQ

PBS&T is a trademark of MEO Engineering Company, Inc. D.B.A.

"Vectra," "Acura," "Micrion 2500," "Micrion 8000," "Micrion 9500," "Vectra 980," "Vectra 986," "Jupiter Head," "FEI," "Micrion," "FEI Company," "V600," "Helios," "FIB400," "FIB400 ACE," "Scios," "Sidewinder," "Certus," "ExSolve," "CLM," "Altura," "Expida," "Tomahawk," and "Phoenix" are trademarks and property of FEI Company, Inc. - now Thermo Fisher Scientific.  Omniprobe and Omni-GIS are trademarks and property of Oxford Instruments.  "Auriga," "Crossbeam," and "Zeiss" are trademarks and property of Carl Zeiss. "Orsay" and "Tescan" are trademarks and property of Tescan-Orsay Holding a.s. "eLINE," "iLINE," and "Raith" are trademarks and property of Raith GmbH. Other trademarks are property of their respective owners. These trademarks are nominatively used for the sole purpose of accurately identifying equipment compatible with PBS&T services, parts, consumables, and accessories.

Platinum Carbon Tungsten Deposition Focused Ion Beam FIB Crucible FEI Thermo


Platinum Tungsten Molybdenum Carbon Focused Ion Beam FIB Orsay Tescan Zeiss SEM


Platinum Tungsten Molybdenum Carbon Deposition Refill GALEX GIS Gas Injector FIB


Tungsten W Molybdenum Mo Deposition Focused Ion Beam Circuit Edit FIB Vectra FEI


Tungsten Molybdenum Deposition Focused Ion Beam FEI Circuit Edit FIB V600 400 G4

MEO Engineering Company, Inc. is providing customized technological solutions and scientific instrumentation, including third-party accessories, consumables, parts, service, and support for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), dual-beam FIB/SEM equipment from various manufacturers. Trademarks identifying supported FIB, SEM, and dual-beam FIB/SEM instrumentaton are property of the respective original equipment manufacturers and nominatively used for the sole purpose of accurately identifying equipment compatible with parts, services, and accessories provided by MEO Engineering Company.

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MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States

vray@partbeamsystech.com