Particle Beam Systems & Technology

MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States

vray@partbeamsystech.com

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Etching Precursor refills

FIB or SEM - any OEM

    PBS&T is a trademark of MEO Engineering Company, Inc.

    "Vectra," "Acura," "Micrion 2500," "Micrion 8000," "Micrion 9500," "Vectra 980," "Vectra 986," "Jupiter Head," "FEI," "Micrion," "FEI Company," "V600," "Helios," "FIB400," "FIB400 ACE," "Scios," "Sidewinder," "Certus," "ExSolve," "CLM," "Altura," "Expida," "Tomahawk," and "Phoenix" are trademarks and property of FEI Company, Inc. - now Thermo Fisher Scientific.  Omniprobe and Omni-GIS are trademarks and property of Oxford Instruments.  "Auriga," "Crossbeam," and "Zeiss" are trademarks and property of Carl Zeiss. "Orsay" and "Tescan" are trademarks and property of Tescan-Orsay Holding a.s. "eLINE," "iLINE," and "Raith" are trademarks and property of Raith GmbH. Other trademarks are property of their respective owners. These trademarks are nominatively used for the sole purpose of accurately identifying equipment compatible with PBS&T services, parts, consumables, and accessories.

    MEO Engineering Company, Inc. is providing customized technological solutions and scientific instrumentation, including third-party accessories, consumables, parts, service, and support for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), dual-beam FIB/SEM equipment from various manufacturers. Trademarks identifying supported FIB, SEM, and dual-beam FIB/SEM instrumentaton are property of the respective original equipment manufacturers and nominatively used for the sole purpose of accurately identifying equipment compatible with parts, services, and accessories provided by MEO Engineering Company.

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    MEO Engineering Company, Inc.
    www.partbeamsystech.com
    www.fibsemproducts.com
    www.freudlabs.com
    United States

    vray@partbeamsystech.com