Peer Reviewed Journals and Conference Proceedings:
"Development of Void-Free FIB Deposition Process for Subhalf-Micrometer High Aspect Ratio Vias" JVST B 21(6), Nov/Dec. 2003      PDF
Virtual Process Chamber Concept ("CUPOLA" nozzle design considerations)        Word File        PDF File
(accepted for publication in Journal of Vacuum Science and Technology, Nov./Dec. 2004)
"Improvements of Secondary Electron Imaging and Endpoint Detection in Focused Ion Beam Circuit Modification",  ISTFA 2003  PDF
"Small Via High Aspect Ratio Circuit Edit: Challenges, Techniques and Developments",  ISTFA 2003 Proceedings  PDF
"Fluorocarbon Precursor for High Aspect Ratio Via Milling in Focused Ion Beam Modification of Integrated Circuits",  ISTFA 2004  Presentation:
PowerPoint   Proceedings:  PDF
“High Aspect Ratio Via Milling Endpoint Phenomena in Focused Ion Beam Modification of integrated Circuits”, ISTFA 2004     Presentation:  
PowerPoint  Proceedings: PDF
“CAD - less Blind Navigation in Focused Ion Beam System ” -   ISTFA 2005 Proceedings  PDF
Conference and Meeting Presentations
"Circuit Edit: Imaging and Endpoint beyond 130 nm",  6th European FIB User Group Meeting, Rimini, Italy, October 2002.  EFUG link      PDF
“Stage Current Monitoring and Endpointing in FIB” 7th European FIB User Group Meeting, October 2003   EFUG link       PDF
“FIB Materials and Processes for High Aspect Ratio Circuit Edit” 7th European FIB User Group,Meeting, October 2003  EFUG link      PDF
"Gas Delivery and Virtual Process Chamber Concept for Gas Assisted Material Processing in Focused Ion Beam System", 48th International
Conference on Electron, Ion, and Photon Beam Technology & Nanofabrication, San Diego, California, USA, June 1-2, 2004
  PowerPoint      PDF
“Recipe Development Considerations for Focused Ion Beam Gas Assisted Etching”, 8th European FIB User Group, October 2004     PowerPoint  
“Advanced Gas Delivery Approach for Focused Particle Beam System” -  8th European FIB User Group, October 2004       PowerPoint     
“High Throughput Milling of HAR Via with Concentrated Gas Delivery” -  9th European FIB User Group, October 2005       PowerPoint     
                                                                                                                and
 FIB User Group Meeting on ISTFA , November 2005   PowerPoint  
“CAD - less Blind Navigation in Focused Ion Beam System ” -  Poster Presentation on ISTFA 2005   PowerPoint
“Processing of Endpoint Information from HAR Vias” -  10th European FIB User Group, October 2004       PowerPoint     
Particle Beam Systems & Technology
“FREUD Methods: FIB Invasive Attacks and Countermeasures” USEIT European Workshop on Information Security, Toulouse, France, July 2007 PDF
“Power Signal Acquisition: Analog Side of Digital Security” -  USEIT European Workshop on Information Security, Toulouse, France, July 2007 PDF
“FREUD Applications of FIB” 2nd FIB User Group Meeting, Washington DC, USA, February 2009  PDF  PowerPoint
“Gas Concentrator in FIB” Q&A session on 2nd FIB User Group Meeting, Washington DC, USA, February 2009  PDF  PowerPoint